Veeco Introduces ContourGT-K0 Surface Metrology System
May 26, 2010
Cost-Effective, Easy-to-Use 3D Optical Profiler for Research & Production
Plainview, NY, May 26, 2010 -- Veeco Instruments Inc. (Nasdaq: VECO), a leading global provider of precision instrumentation and metrology solutions for scientific and industrial markets, today announced a new low-cost member of its ContourGT TM family of non-contact, 3D optical surface profilers. The ContourGT-K0 Surface Metrology System combines streamlined architecture and functionality with significantly improved measurement and computing hardware and software, making it the industry's most advanced and easiest-to-use low-cost, 3D optical surface profiler.
"With its intuitive user interface and improved throughput capabilities, our ContourGT product line is being very well received by our industrial and research customers," said Mark R. Munch, Ph.D., Executive Vice President, Veeco Metrology & Instrumentation. "By adding the low-cost K0 version, we have brought top metrology performance and ease-of-use to the more cost-sensitive QA/QC production and R&D applications, including precision machining, medical, printing, high-brightness LED and solar."
Ross Q. Smith, Vice President and General Manager, Veeco Optical Industrial Metrology, added, "As the precision manufacturing industry pursues ever tightening tolerances and quality assurance criteria, we see a rapidly growing market for simple-to-operate, high-performance, yet low-cost, non-contact, quantitative 3D surface profilers that can replace traditional, 2D contact-based systems. The ContourGT-K0 epitomizes this combination, and we expect it to be the industry's benchmark in this category."
The tabletop ContourGT-K0 is the entry-level model of the ContourGT product line, which includes a range of profilers designed to meet the technical requirements and budgets for virtually every type of production and R&D precision surface metrology application. The systems utilize patented, higher brightness dual-LED illumination combined with superior vertical resolution to provide greatly improved sensitivity and stability, enabling precision non-contact 3D surface metrology in difficult applications and environments that are challenging for other white light interferometry systems. The entire ContourGT Family also features Veeco's new Vision64 TM Operation and Analysis Software and the industry's most intuitive, modular user interface to deliver user-level-customization capabilities for the widest possible range of surface profiling metrology applications. For more information about the ContourGT-K0 or other ContourGT models or to schedule a demo, please visit www.veeco.com/ContourGT , email email@example.com , or call +1 (520) 741-1044.
Veeco Instruments Inc. designs, manufactures, markets and services enabling solutions for customers in the HB-LED, solar, data storage, semiconductor, scientific research and industrial markets. We have leading technology positions in our three businesses: LED & Solar Process Equipment, Data Storage Process Equipment, and Metrology Instruments. Veeco's product development, marketing, engineering and manufacturing facilities are located in New York, New Jersey, California, Colorado, Arizona, Massachusetts and Minnesota. Global sales and service offices are located throughout the U.S., Europe, Japan and Asia Pacific. http://www.veeco.com/
To the extent that this news release discusses expectations or otherwise makes statements about the future, such statements are forward-looking and are subject to a number of risks and uncertainties that could cause actual results to differ materially from the statements made. These factors include the risks discussed in the Business Description and Management's Discussion and Analysis sections of Veeco's Annual Report on Form 10-K for the year ended December 31, 2009 and in our subsequent quarterly reports on Form 10-Q, current reports on Form 8-K and press releases.Veeco does not undertake any obligation to update any forward-looking statements to reflect future events or circumstances after the date of such statements.